RoDLA: Benchmarking the Robustness of Document Layout Analysis Models

  • Author:

    Y. Chen, J. Zhang, K. Peng, J. Zheng, R. Liu, P. Torr, R. Stiefelhagen
  • Source:

    The IEEE/CVF Conference on Computer Vision and Pattern Recognition 2024, Seattle, United States
  • Date: 2024/06
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